Comments on Roundtable on Short Selling Price Test Restrictions and Short Sale Circuit Breakers


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Date Sort descending Letter Type Commenter Name
Public Comment Donald R. Davis, Ph.D., Austin, Texas
Public Comment Michael W. Crum, Fredericksburg, Virginia
Public Comment Mark Hagen, Moscow, Idaho
Public Comment Phillip V. Hamilton, Mathematics student, Actuary, Durand, Michigan
Public Comment Pierre J. E. Lalonde, Ottawa, Canada
Public Comment Joel G. Chaiken, Ph.D., President, Delafield Database Solutions, Bronx, New York
Public Comment S. W.
Public Comment Vincent Giganti, Cleveland, Ohio
Public Comment Pat L. Gualtieri, Mississauga, Canada
Public Comment Stephen L. Davis, Boca Raton, Florida
Public Comment Edmund Dante
Public Comment Bob Dougherty
Public Comment Les Lackman, Los Angeles, California
Public Comment Michael P. Rogers, Bradenton, Florida
Public Comment Stephen T. Faust, NASA Engineer, Houston, Texas
Public Comment Larry E. Licht
Public Comment Charles H. Jolly, Jr., Curwensville, Pennsylvania
Public Comment T. J. Fitzpatrick, Detroit , Michigan
Public Comment Earl E. Bennett, Erlanger, Kentucky
Public Comment Monica Piquette
Public Comment Jay H. Hardison, CEO, Interest Capturing Systems, LLC, Darien, Connecticut
Public Comment Garold R. May, Garland, Texas
Public Comment Jeff Giampaolo, Newhall, California
Public Comment Fazal Khan, Ph.D in Economics, Chicago, Illinois
Public Comment Henry C. Warner, St. Augustine, Florida
Public Comment Panos Leh, United Kingdom
Public Comment Phillip M. Brauckmann, Athens, Georgia
Public Comment Frank L. Hohmann, III, New York, New York
Public Comment Jan W., Florida
Public Comment Jery M. Ellison, Pittsboro, Mississippi

Last Reviewed or Updated: Dec. 18, 2025

File Number
4-581